Fabmatics Breakout Session Recording & Presentation Files

At the Innovation Forum for Automation 2025, Fabmatics hosted an exclusive breakout session, “Test Wafers – The Hidden Gems in Your Fab”, where industry experts explored the challenges and opportunities in test wafer management. With over 80 engaged participants, a live simulation, and an expert discussion, the session provided actionable insights into optimizing fab efficiency.

Now, we are offering you exclusive access to the full session recording and presentation slides – simply leave your contact details and sign up for our mailing list to unlock the content.

What You’ll Gain

✅ Impulse Presentation: Discover the hidden potential of non-product wafers and how to optimize their planning, dispatching, and reclaim.
✅ Live Simulation: Experience a real-time simulation of automation and digital twin solutions for test wafer management.
✅ Best Practice Case & Expert Discussion: Learn how Infineon Regensburg implements test wafer management to drive efficiency.

Why This Matters

Effective test wafer management is critical for fab performance and cost efficiency. By accessing this content, you’ll gain exclusive knowledge from industry leaders and discover new strategies to enhance your semiconductor manufacturing processes.

How to access the recordings and download the presentations

Sign up for our newsletter to receive instant access to the recording and presentation files. Don’t miss out on these valuable insights, and stay ahead in fab automation!

 

Do you have questions?

Our automation experts are looking forward to your questions and inquiries and are at your disposal for specific appointments!

Fabmatics Sales Team

Phone: +49 351 65237-215